Kyoto, Japan

Syouichi Tanaka

This inventor holds 1 USPTO granted patent. Top assignee: Panasonic Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Syouichi Tanaka. Retrieved from https://idiyas.com/inventor/syouichi-tanaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Syouichi Tanaka

Syouichi Tanaka is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of optical devices, particularly through his innovative patent.

Latest Patents

One of Syouichi Tanaka's key patents is titled "Device for testing a light-emitting optical device using a socket." This invention allows for testing optical devices that have varying positional relationships between the contact face of an external terminal and the direction of light emitted from a semiconductor laser element. This advancement enhances the efficiency and accuracy of testing optical devices.

Career Highlights

Syouichi Tanaka is associated with Panasonic Corporation, a leading company in electronics and technology. His work at Panasonic has allowed him to focus on developing cutting-edge technologies that improve optical device testing.

Collaborations

Throughout his career, Syouichi has collaborated with talented individuals such as Toru Nishikawa and Isao Hayami. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Syouichi Tanaka's contributions to the field of optical devices through his patent and work at Panasonic Corporation highlight his role as an influential inventor. His innovative spirit continues to drive advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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