The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2009

Filed:

Mar. 14, 2006
Applicants:

Isao Hayami, Hyogo, JP;

Toru Nishikawa, Osaka, JP;

Masaya Tateyanagi, Shiga, JP;

Syouichi Tanaka, Kyoto, JP;

Inventors:

Isao Hayami, Hyogo, JP;

Toru Nishikawa, Osaka, JP;

Masaya Tateyanagi, Shiga, JP;

Syouichi Tanaka, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 5/02 (2006.01); H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tester according to the present invention can conduct a test on optical devices each having a different positional relation between a position of a contact face of an external contact terminal and a direction of light emitted from a semiconductor laser element.


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