Syed Shoaib Hasan Zaidi

Title: Syed Shoaib Hasan Zaidi: Innovator in Optical Measurement Technologies

Introduction

Syed Shoaib Hasan Zaidi is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of optical measurement, holding a total of 3 patents. His work focuses on enhancing measurement techniques through innovative methods and technologies.

Latest Patents

One of his latest patents is titled "Optical measurement of device features using lenslet array illumination." This invention improves the measurement of features formed in a substrate by using lenslet array illumination. The method increases the signal-to-noise ratio of the measurement signal, thereby enhancing the sensitivity of the measurement. Another significant patent is "Mask and method for using the mask in lithographic processing." This invention discloses a method and mask designed to improve the measurement of alignment marks. It includes a resist mask with a patterned alignment mark that comprises an assemblage of features whose spacing is smaller than the wavelength of light used for measurement.

Career Highlights

Throughout his career, Syed has worked with prominent companies such as Infineon Technologies AG and Infineon Technologies North America Corporation. His experience in these organizations has contributed to his expertise in optical measurement technologies.

Collaborations

Syed has collaborated with notable professionals in his field, including Alois Gutmann and Gary Williams. Their joint efforts have further advanced the innovations in optical measurement.

Conclusion

Syed Shoaib Hasan Zaidi is a distinguished inventor whose work in optical measurement technologies has led to significant advancements in the field. His patents reflect his commitment to improving measurement techniques and enhancing the sensitivity of optical devices.