Susan L Stirrat

Title: Innovations by Susan L. Stirrat

Introduction

Susan L. Stirrat is an accomplished inventor based in Windsor, Colorado. She has made significant contributions to the field of integrated circuit testing through her innovative patents. With a total of two patents to her name, her work focuses on optimizing testing processes and improving efficiency.

Latest Patents

Susan's latest patents include the "N-squared algorithm for optimizing correlated events" and an "Empirical data based test optimization method." The N-squared algorithm is designed to optimize the detection of redundant and inefficient tests in integrated circuits. It utilizes N L-dimensional correlation vectors to minimize the number of tests required to identify defects. This algorithm operates efficiently with O(N) operations, ensuring that the testing process is both effective and time-efficient.

The empirical data based test optimization method aims to detect redundant tests and improve test flow. By collecting empirical data during test execution, this method identifies inefficient tests and allows for their reordering or removal. This optimization leads to a reduction in test complexity and duration, enhancing the overall testing process for integrated circuits.

Career Highlights

Susan L. Stirrat is currently employed at Agilent Technologies, Inc., where she continues to develop innovative solutions for testing integrated circuits. Her expertise in algorithm development and test optimization has positioned her as a key contributor in her field.

Collaborations

One of her notable collaborators is Kang Wu, with whom she has worked closely on various projects related to test optimization and algorithm development.

Conclusion

Susan L. Stirrat's contributions to the field of integrated circuit testing through her innovative patents demonstrate her commitment to enhancing testing efficiency. Her work continues to influence the industry positively, making her a notable figure in the realm of inventions.