This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2011.
Company Filing History:
Years Active: 2011
Title: Susan G Conti: Innovator in Wafer Failure Prediction
Introduction
Susan G Conti is a notable inventor based in Hopewell Junction, NY (US). She has made significant contributions to the field of semiconductor technology, particularly in predicting wafer failure. Her innovative approach has the potential to enhance the quality and reliability of semiconductor manufacturing processes.
Latest Patents
Susan holds a patent titled "Predicting wafer failure using learned probability." This patent presents techniques for estimating the quality of one or more wafers. The process involves testing one or more first wafers comprising one or more first dies. A probability of wafer failure is determined based on one or more first test measurements of the first dies. Subsequently, a pass or fail status of one or more second wafers is inferred by testing selected second dies and evaluating their test measurements in accordance with the determined probability of wafer failure. This innovative method aims to improve the efficiency and accuracy of wafer testing.
Career Highlights
Susan is currently associated with International Business Machines Corporation (IBM), where she continues to work on advancing semiconductor technologies. Her expertise and innovative mindset have positioned her as a valuable asset in her field.
Collaborations
Throughout her career, Susan has collaborated with esteemed colleagues, including Frederick A Scholl and Michal Rosen-Zvi. These collaborations have further enriched her work and contributed to the development of cutting-edge technologies.
Conclusion
Susan G Conti is a pioneering inventor whose work in predicting wafer failure has the potential to transform semiconductor manufacturing. Her contributions reflect her dedication to innovation and excellence in technology.