The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Dec. 08, 2008
Robert Jeffrey Baseman, Brewster, NY (US);
Susan G. Conti, Hopewell Junction, NY (US);
William A. Muth, Lagrangeville, NY (US);
Michal Rosen-zvi, Jerusalem, IL;
Frederick A. Scholl, Hopewell Junction, NY (US);
Robert Jeffrey Baseman, Brewster, NY (US);
Susan G. Conti, Hopewell Junction, NY (US);
William A. Muth, Lagrangeville, NY (US);
Michal Rosen-Zvi, Jerusalem, IL;
Frederick A. Scholl, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for estimating a quality of one or more wafers are presented. One or more first wafers comprising one or more first dies are tested. A probability of wafer failure is determined in accordance with one or more first test measurements of the one or more first dies. A pass status and/or a fail status of one or more second wafers is inferred by testing a select one or more second dies of the one or more second wafers and evaluating one or more second test measurements of the select one or more second dies in accordance with the determined probability of wafer failure.