Folsom, CA, United States of America

Sunil R Atri

This inventor holds 3 USPTO granted patents. Top assignee: Intel Corporation. Active years: 2007-2011.


Average Co-Inventor Count = 2.4

ph-index = 3

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2007-2011

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3 patents (USPTO):Explore Patents

Title: Innovations by Sunil R Atri

Introduction

Sunil R Atri is a notable inventor based in Folsom, CA. He has made significant contributions to the field of technology, particularly in power loss recovery mechanisms. With a total of 3 patents, Atri's work has garnered attention for its innovative approaches to enhancing device reliability.

Latest Patents

One of Atri's latest patents is titled "Volatile storage based power loss recovery mechanism." This invention involves storing power loss recovery information related to an active operation in volatile memory. Upon detecting a power loss condition, this information is copied to non-volatile memory. When power is restored, the recovery information is utilized to complete or correct the interrupted operation. Another significant patent is "Device, system and method for power loss recovery procedure for solid state non-volatile memory." This patent outlines a method, device, and system for determining if a prior shutdown of a device with solid state non-volatile memory, such as flash memory, was due to a power loss and whether a recovery procedure should be initiated.

Career Highlights

Sunil R Atri is currently employed at Intel Corporation, where he continues to innovate and develop new technologies. His work at Intel has positioned him as a key player in advancing power recovery solutions in electronic devices.

Collaborations

Atri collaborates with talented individuals such as Nicholas Woo and Kurt E Sowa, contributing to a dynamic work environment that fosters innovation.

Conclusion

Sunil R Atri's contributions to technology, particularly in power loss recovery mechanisms, highlight his role as an influential inventor. His patents reflect a commitment to improving device reliability and performance.

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