Little Elm, TX, United States of America

Sunil Lawrence

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Capital One Services, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sunil Lawrence. Retrieved from https://idiyas.com/inventor/sunil-lawrence

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sunil Lawrence: Innovator in Clustering-Based Deviation Pattern Recognition

Introduction

Sunil Lawrence is an accomplished inventor based in Little Elm, TX (US). He has made significant contributions to the field of data processing and machine learning. His innovative work focuses on recognizing deviation patterns through clustering techniques.

Latest Patents

Sunil holds a patent for a technology titled "Clustering-based deviation pattern recognition." This invention involves a device that processes data associated with various accounts to identify clustering information. The device clusters the data and utilizes a machine learning model to detect deviation patterns within these clusters. Furthermore, it determines operations to mitigate deviations and performs actions based on these operations.

Career Highlights

Sunil Lawrence is currently employed at Capital One Services, LLC, where he applies his expertise in data analysis and machine learning. His work has been instrumental in enhancing the company's capabilities in recognizing and addressing data anomalies.

Collaborations

Sunil collaborates with talented professionals, including his coworker Komal Krishna Pandamaneti. Together, they contribute to innovative projects that leverage advanced data processing techniques.

Conclusion

Sunil Lawrence is a notable inventor whose work in clustering-based deviation pattern recognition showcases his commitment to innovation in data processing. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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