The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Sep. 13, 2023
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Komal Krishna Pandamaneti, Frisco, TX (US);

Lewis C. Wong, Dallas, TX (US);

Dinesh Vajala, Plano, TX (US);

Sunil Lawrence, Little Elm, TX (US);

Jason E. Lines, Prosper, TX (US);

Stephen Michael Lipner-Bernstein, Frisco, TX (US);

Sriram Ganta, McKinney, TX (US);

Siva R. Vegesana, Frisco, TX (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/2325 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2325 (2023.01);
Abstract

In some implementations, a device may obtain first data associated with one or more accounts. The device may process the first data to obtain clustering information associated with the first data. The device may cluster the first data into one or more clusters based on the clustering information. The device may identify, via a second machine learning model, one or more deviation patterns associated with a portion of the first data that is included in a cluster of the one or more clusters. The device may determine, for the cluster, one or more operations to be performed to mitigate deviations based on the one or more deviation patterns. The device may perform an action, that is based on the one or more operations, associated with second data grouped into the cluster.


Find Patent Forward Citations

Pandamaneti, Komal. (2026). Clustering-based deviation pattern recognition (U.S. Patent No. 12613940). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12613940

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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