Suwon, South Korea

Sungwon Yun

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sungwon Yun. Retrieved from https://idiyas.com/inventor/sungwon-yun-d7r1mljk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sungwon Yun: Inventor in Wireless Network Management.

Introduction

Sungwon Yun is an inventor based in Suwon, South Korea, and is associated with Samsung Electronics Ltd. His patent work concerns geo-redundancy awareness and network slice management in wireless network systems.

Latest Patents

Yun is named on one patent, 1 patent: “Geo redundancy aware network slice management function (NSMF) in a wireless network system.” The invention describes a method in which an active network slice management function requests geo-redundancy information from a controller. The response includes synchronization status between active and standby management functions, as well as the current state of each. The active function uses this information to determine and perform actions for life cycle management operations.

Career Highlights

Yun’s listed patent reflects work on the coordination of active and standby network management functions across cloud orchestrator nodes. This approach uses synchronization and state information to guide life cycle management in wireless networks.

Collaborations

Yun’s listed coworkers include Ganesh Chandrasekaran and Shailendra Rajpoot. His patent is associated with Samsung Electronics Ltd.

Conclusion

Sungwon Yun’s patent focuses on using geo-redundancy information to support reliable network slice management and life cycle operations in wireless systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…