This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Mirae Corporation, Skhynix Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2026
Title: Innovations of Sung Yong Yu in Graphics Chip Testing
Introduction
Sung Yong Yu is an accomplished inventor based in Cheonan, South Korea. He has made significant contributions to the field of graphics chip testing, showcasing his expertise through his innovative patent.
Latest Patents
Sung Yong Yu holds a patent for a "Test handler for graphics chip." This invention relates to a test handler that includes a loading unit for loading a graphics chip to be tested, an unloading unit for unloading a tested graphics chip, and a test unit that conducts the testing. The design incorporates a buffer unit that facilitates the transfer of graphics chips between the loading and test units, as well as between the unloading and test units. Notably, the test unit features a commercial graphics card that mirrors a practically used graphics card, along with a contact unit that connects the commercial graphics card to the graphics chip under test. This innovative approach enhances the efficiency and accuracy of graphics chip testing.
Career Highlights
Throughout his career, Sung Yong Yu has worked with notable companies, including Mirae Corporation and SK Hynix Inc. His experience in these organizations has contributed to his development as a leading inventor in the technology sector.
Collaborations
Sung Yong Yu has collaborated with various professionals in his field, including his coworker Ung-Hyun Yoo. Their joint efforts have further advanced the innovations in graphics chip testing.
Conclusion
Sung Yong Yu's contributions to the field of graphics chip testing through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence advancements in technology and improve testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile