The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jul. 03, 2024
Applicants:

Mirae Corporation, Cheonan-si, KR;

SK Hynix Inc., Icheon-si, KR;

Inventors:

Kyung Tae Kim, Suwon-si, KR;

Sung Yong Yu, Cheonan-si, KR;

Ung-Hyun Yoo, Suwon-si, KR;

Kuk-Hyung Lee, Suwon-si, KR;

Seok Heo, Icheon-si, KR;

Chang Hoon Baek, Icheon-si, KR;

Assignees:

MIRAE Corporation, Cheonan-si, KR;

SK HYNIX INC., Icheon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/20 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06T 1/20 (2013.01); G06F 11/2236 (2013.01); G06T 2200/28 (2013.01);
Abstract

The present invention relates to a test handler for graphics chip including a loading unit performing a loading process of loading a graphics chip which is to be tested, an unloading unit performing an unloading process of unloading a tested graphics chip, a test unit testing the graphics chip which is to be tested, a buffer unit transferring a graphics chip between the loading unit and the test unit and transferring a graphics chip between the unloading unit and the test unit, wherein the test unit includes a commercial graphics card which is the same as a practically used graphics card and a contact unit connecting the commercial graphics card to the graphics chip which is to be tested.


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