Icheon-si, South Korea

Chang Hoon Baek

This inventor holds 1 USPTO granted patent. Top assignees: Mirae Corporation, Skhynix Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chang Hoon Baek. Retrieved from https://idiyas.com/inventor/chang-hoon-baek-iu09sjfv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chang Hoon Baek: Innovator in Graphics Chip Testing

Introduction

Chang Hoon Baek is a notable inventor based in Icheon-si, South Korea. He has made significant contributions to the field of graphics chip testing, showcasing his expertise through his innovative patent.

Latest Patents

Chang Hoon Baek holds a patent for a "Test handler for graphics chip." This invention includes a loading unit that performs the loading process of a graphics chip to be tested, an unloading unit for unloading a tested graphics chip, and a test unit that conducts the testing. The design also features a buffer unit that transfers the graphics chip between the loading unit and the test unit, as well as between the unloading unit and the test unit. Notably, the test unit incorporates a commercial graphics card that mirrors a practically used graphics card, along with a contact unit that connects the commercial graphics card to the graphics chip being tested. He has 1 patent to his name.

Career Highlights

Throughout his career, Chang Hoon Baek has worked with prominent companies in the technology sector. He has been associated with Mirae Corporation and SK Hynix Inc., where he has contributed to advancements in graphics technology.

Collaborations

Chang Hoon Baek has collaborated with various professionals in his field, including his coworker Sung Yong Yu. Their joint efforts have furthered the development of innovative solutions in graphics chip testing.

Conclusion

Chang Hoon Baek's contributions to the field of graphics chip testing highlight his innovative spirit and dedication to technology. His patent and career achievements reflect his significant impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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