Suwon, South Korea

Sung-Man Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sung-Man Lee. Retrieved from https://idiyas.com/inventor/sung-man-lee-uif2o4sn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Sung-Man Lee

Introduction

Sung-Man Lee is a prominent inventor based in Suwon-si, South Korea, known for his contributions to advanced wafer inspection technology. With a commendable patent portfolio, he holds a significant patent in the field of semiconductor manufacturing that reflects innovation and attention to detail.

Latest Patents

Sung-Man Lee's key patent, titled "Apparatus and method for inspecting patterns on wafers," outlines a sophisticated approach to wafer pattern inspection. This invention features an image sensor that acquires image data from both a reference die and a sample die. The system includes an external memory for storing image data, encoders for compressing that data, and decoders for decompressing it. An internal memory device keeps a record of the compressed image data of the reference die. The invention's arithmetic module processes this image data to extract reference images, while a comparison module enables the extraction of defect data by comparing the sample die's image data with the reference image data.

Career Highlights

Sung-Man Lee is currently associated with Samsung Electronics Co., Ltd., a leading global player in the electronics sector. His expertise in semiconductor technologies has bolstered the company's commitment to innovation and quality. His work continues to impact the way wafers are inspected, ensuring higher precision and efficiency in the manufacturing process.

Collaborations

Sung-Man Lee collaborates closely with fellow engineers and inventors, including colleagues Chang-Hoon Lee and Byung-Am Lee. Together, they leverage their collective expertise to push the boundaries of semiconductor technology and contribute to the advancement of the industry.

Conclusion

Sung-Man Lee's dedication to innovation in wafer inspection technology is evident through his inventive contributions. His patent not only enhances Samsung Electronics Co., Ltd.'s technological capabilities but also sets a benchmark for future advancements in the field. As the semiconductor industry continues to evolve, inventors like Sung-Man Lee play a crucial role in shaping its future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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