Sung-Kuang Wu

Title: Sung-Kuang Wu and Memory-Test Innovations.

Introduction

Sung-Kuang Wu is an inventor based in Taipei, Taiwan, whose patent work focuses on memory testing and built-in self-test systems. His inventions address ways to evaluate memory devices while making efficient use of testing time and hardware resources. Wu is associated with Realtek Semiconductor Corporation and has 2 patents listed in the information provided.

Latest Patents

Wu’s listed patents concern test architectures for memory and related storage systems.

“Test System Which Shares a Register in Different Modes” describes a system that uses a register in two operating modes. In the first mode, a built-in self-test (BIST) circuit sends a signal through a storage apparatus, and the register returns the resulting signal to the BIST circuit for testing. In the second mode, a logic circuit sends a signal to the register, which then passes the registered signal to another logic circuit. Sharing the register across these modes supports both storage testing and other logic operations.

“Memory with Self-Test Function and Method for Testing the Same” presents a memory-testing method that uses a testing unit, a memory unit, and a comparison module. The memory is divided into two storage blocks: one stores data, while the other stores a corresponding comparison signature. The comparison module generates a test signature from the stored data, compares it with the reference signature, and produces a result to assess the memory’s validity. The described arrangement aims to reduce testing time, costs, and hardware requirements.

Career Highlights

Wu’s patent portfolio, as represented by the two inventions provided, centers on practical approaches to testing memory systems. Both designs use structured signal handling and comparison processes to support reliable evaluation of storage components.

Collaborations

Wu is associated with Realtek Semiconductor Corporation. The coworkers identified in the provided information are Shuo-Fen Kuo and Jih-Nung Lee.

Conclusion

Sung-Kuang Wu’s listed inventions focus on efficient memory testing, including a shared-register test system and a memory architecture that compares stored data against a reference signature.