Sung Hoon Lee

Title: Innovations of Sung Hoon Lee in Semiconductor Testing

Introduction

Sung Hoon Lee is a notable inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of semiconductor testing, particularly through his innovative designs and patents. His work has been instrumental in advancing technology in this critical area.

Latest Patents

One of Sung Hoon Lee's key patents is titled "Probe for testing a semiconductor device and a probe card including the same." This invention features a probe designed for testing semiconductor devices, which includes a post with a plate shape connected to a test substrate. The design incorporates a beam with a first end connected to the post and a tip structure at the second end of the beam. The post has a front surface with bumps that are spaced apart, enhancing the testing capabilities of semiconductor devices. This patent showcases his expertise and innovative approach to solving complex problems in semiconductor testing. He holds 1 patent.

Career Highlights

Sung Hoon Lee has worked with prominent companies in the technology sector, including Samsung Electronics Co., Ltd. and Korea Instrument Co., Ltd. His experience in these organizations has allowed him to develop and refine his skills in semiconductor technology and innovation.

Collaborations

Throughout his career, Sung Hoon Lee has collaborated with talented individuals such as Gyuyeol Kim and Yu-kyum Kim. These collaborations have contributed to the advancement of his projects and innovations in the field.

Conclusion

Sung Hoon Lee's contributions to semiconductor testing through his innovative patents and collaborations highlight his importance in the field. His work continues to influence the technology landscape, paving the way for future advancements.