Cupertino, CA, United States of America

Sundararaman Narayanan

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Applied Materials, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sundararaman Narayanan. Retrieved from https://idiyas.com/inventor/sundararaman-narayanan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sundararaman Narayanan: Inventor in Semiconductor Process Modeling.

Introduction

Sundararaman Narayanan is an inventor based in Cupertino, California, whose work includes a patent related to semiconductor process modeling. His disclosed invention uses elemental mapping data to help refine models of technological processes performed in substrate processing equipment.

Latest Patents

Narayanan is associated with 1 patent: “Using Elemental Maps Information from X-Ray Energy-Dispersive Spectroscopy Line Scan Analysis to Create Process Models.” The patent describes a method that uses a model to predict how one or more stages of a technological process will change a sample’s physical state. It then obtains imaging data from the actual process, including the distribution of chemical elements across regions of the sample. By comparing the predicted and actual changes, the method identifies a difference and uses it to determine model parameters. This approach can help improve process models through analysis of material data.

Career Highlights

Narayanan is associated with Applied Materials, Inc., a company that develops equipment and technologies for semiconductor manufacturing. His patent reflects work at the intersection of materials analysis, imaging, and process modeling.

Collaborations

Anantha R. Sethuraman is identified as Narayanan’s coworker. The available information does not specify their particular collaboration or respective contributions to the patent.

Conclusion

Sundararaman Narayanan’s patent describes a data-driven approach to improving models of substrate processing by comparing predicted outcomes with elemental imaging from actual process performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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