Gyeonggi-do, South Korea

Sun Woong Hur

This inventor holds 1 USPTO granted patent. Top assignees: Small Machines, Yonsei University. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sun Woong Hur. Retrieved from https://idiyas.com/inventor/sun-woong-hur

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Sun Woong Hur: Innovator in Microscope Technology

Introduction

Sun Woong Hur is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of microscopy, particularly with his innovative approach to calibrating light sources in microscope apparatuses. His work has implications for enhancing the accuracy and efficiency of microscopic imaging.

Latest Patents

Sun Woong Hur holds a patent for a "Microscope apparatus and method for calibrating position of light source." This invention provides a microscope apparatus that includes a light source unit, an optical unit, an image sensor, and a processor. The processor is designed to calibrate the position of the light source based on multiple images generated by the image sensor. This advancement is crucial for improving the quality of images obtained through microscopy.

Career Highlights

Throughout his career, Sun Woong Hur has worked with esteemed institutions such as Yonsei University and Small Machines. His experience in these organizations has allowed him to develop and refine his innovative ideas in microscopy.

Collaborations

Sun Woong Hur has collaborated with notable colleagues, including Seung Ri Song and Chul Min Joo. Their combined expertise has contributed to the development of advanced technologies in the field.

Conclusion

Sun Woong Hur's contributions to microscope technology through his patented inventions demonstrate his commitment to innovation in the field. His work continues to influence the way microscopic imaging is conducted, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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