The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 10, 2019
Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;
Small Machines, Daejeon, KR;
Chul Min Joo, Gyeonggi-do, KR;
Seung Ri Song, Seoul, KR;
Sun Woong Hur, Gyeonggi-do, KR;
Jun Kyu Choi, Seoul, KR;
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY, Seoul, KR;
SMALL MACHINES, Daejeon, KR;
Abstract
There is provided a microscope apparatus and method for calibrating the position of a light source according to an embodiment of the present disclosure. A microscope apparatus according to an embodiment of the present disclosure includes: a light source unit configured to radiate light onto an subject and including a light emitting element array having a plurality of light emitting elements; an optical unit disposed in parallel with the subject and configured to form enlarged images of the subject receiving the radiated light; an image sensor configured to generate enlarged pictures of the subject based on the enlarged images formed through the optical unit; and a processor operably connected with the light source unit, the optical unit, and the image sensor, and calibrating a position of the light source unit based on a plurality of images generated by the image sensor.