This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Intekplus Co., Ltd.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Sun Hwan Kim: Innovator in Roll-to-Roll Inspection Systems
Introduction
Sun Hwan Kim is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of inspection systems, particularly in roll-to-roll equipment. His innovative approach has led to the development of a unique patent that enhances the efficiency and accuracy of inspection processes.
Latest Patents
Sun Hwan Kim holds a patent for an "Inspection system for roll-to-roll equipment." This system features a pair of vision devices supported by a base frame, spaced apart in the Y-axis direction. Each vision device includes a main illuminator that obliquely emits light to illuminate a target object, and a sub-illuminator that removes shadows created by the main illuminator. A camera is positioned between these illuminators, allowing for precise imaging. The system also includes an X-axis moving unit that adjusts the position of the vision devices relative to the guide roller, enhancing the inspection process.
Career Highlights
Sun Hwan Kim is currently employed at Intekplus Co., Ltd., where he continues to innovate and develop advanced inspection technologies. His work has been instrumental in improving the quality control processes in manufacturing environments that utilize roll-to-roll systems.
Collaborations
Sun Hwan Kim collaborates with talented colleagues, including Daekab Kwon and Young Jun Park. Their combined expertise contributes to the advancement of technologies in their field.
Conclusion
Sun Hwan Kim's contributions to the field of inspection systems demonstrate his commitment to innovation and excellence. His patent for the roll-to-roll inspection system showcases his ability to solve complex challenges in manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
