Bengaluru, India

Sumit Panigrahi

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sumit Panigrahi. Retrieved from https://idiyas.com/inventor/sumit-panigrahi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Sumit Panigrahi

Introduction

Sumit Panigrahi is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of integrated circuit testing. His innovative approach has led to the development of a unique patent that addresses critical challenges in the industry.

Latest Patents

Sumit holds a patent for a method and apparatus titled "Dynamically Power Noise Adaptive Automatic Test Pattern Generation." This invention focuses on testing integrated circuits by retrieving power distribution data and designating segments that include components of the circuit. A switching limit associated with these segments is established based on the power distribution data, allowing for the generation of effective testing patterns.

Career Highlights

Sumit is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to explore and implement innovative solutions in the realm of technology and integrated circuits. His dedication to advancing the field is evident through his patent and ongoing projects.

Collaborations

Some of Sumit's coworkers include Steven Michael Douskey and Raghu Gaurav GopalaKrishnaSetty. Their collaboration fosters a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Sumit Panigrahi exemplifies the spirit of innovation in the technology sector. His contributions, particularly through his patent, highlight the importance of advancements in integrated circuit testing. His work continues to inspire future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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