The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Jan. 16, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Steven M. Douskey, Rochester, MN (US);
Raghu G. Gopalakrishnasetty, Bangalore, IN;
Sumit Panigrahi, Bangalore, IN;
Mary P. Kusko, Hopewell Junction, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/3183 (2006.01); G01R 31/3181 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/3183 (2013.01); G01R 31/31707 (2013.01); G01R 31/31721 (2013.01); G01R 31/31813 (2013.01); G01R 31/318335 (2013.01); G01R 31/318533 (2013.01); G01R 31/318544 (2013.01); G01R 31/318575 (2013.01);
Abstract
Method and apparatus to test an integrated circuit includes retrieving power distribution data relating to an integrated circuit and designating a segment that includes at least one component of the integrated circuit. A switching limit associated with the segment may be set based on the power distribution data. Processes further generate a testing pattern that includes the determined switching limit associated with the segment.