This inventor holds 1 USPTO granted patent. Top assignee: Cypress Semiconductor Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Sumeet Mali - Innovator in Fault Detection Technologies
Introduction
Sumeet Mali is a notable inventor based in Dublin, Ireland. He has made significant contributions to the field of fault detection technologies. His innovative approach has led to the development of a unique patent that enhances the reliability of fault monitoring systems.
Latest Patents
Sumeet Mali holds a patent for a "Fault Overrun Detection Feature." This invention discloses techniques for a fault monitor to ensure that no fault is lost during processing. The fault monitor is capable of distinguishing between critical and non-critical faults, thereby minimizing the risk of missing critical fault events. It can detect new fault events from a fault source and set a fault overrun flag when a new fault event is detected while an existing fault event is being processed. Upon receiving a fault acknowledgment indicating the completion of processing the existing fault event, the fault monitor generates a request to process the new fault event as an overrun fault if the fault overrun flag is set. Conversely, if the new fault event is detected without an existing fault event being processed, it generates a request to process it as a non-overrun fault. This innovation is crucial for enhancing the efficiency and reliability of fault detection systems.
Career Highlights
Sumeet Mali is currently employed at Cypress Semiconductor Corporation, where he continues to work on advancing technologies in the semiconductor industry. His expertise in fault detection has positioned him as a valuable asset to his team and the company.
Collaborations
Some of Sumeet's coworkers include Kai Dieffenbach and Richard Landenbach. Their collaborative efforts contribute to the innovative environment at Cypress Semiconductor Corporation.
Conclusion
Sumeet Mali's contributions to fault detection technologies exemplify the impact of innovative thinking in the semiconductor industry. His patent for the fault overrun detection feature showcases his commitment to enhancing system reliability.