Subodh Singh

Title: Subodh Singh: A Pioneer in Metrology Innovation

Introduction: Subodh Singh, a visionary inventor based in Eindhoven, NL, has been at the forefront of metrology innovation, with a notable dedication to pushing the boundaries of technology. His relentless pursuit of excellence continues to inspire the next generation of inventors and shape the future of the industry.

Latest Patents: Subodh Singh's most recent patent is for a "Metrology apparatus - Methods and apparatuses for determining in-plane distortion (IPD) across a substrate having a plurality of patterned regions." This innovative method involves obtaining intra-region data indicative of local stress distribution, determining inter-region data for global stress distribution, and ultimately calculating the IPD across the substrate.

Career Highlights: Subodh Singh is a valued member of the renowned company ASML Netherlands B.V., where he has made significant contributions to the field of metrology. His expertise and inventiveness have led to the development of cutting-edge technologies that have revolutionized the way in which in-plane distortion is measured and analyzed.

Collaborations: Throughout his career, Subodh Singh has collaborated closely with esteemed colleagues such as Leon Paul Van Dijk and Richard Johannes Franciscus Van Haren. Together, they have worked tirelessly to innovate and drive forward advancements in metrology, setting new standards for precision and accuracy in the industry.

Conclusion: Subodh Singh's passion for innovation and his remarkable achievements in the field of metrology serve as a testament to his dedication and vision. His pioneering work not only impacts the present state of technology but also paves the way for future breakthroughs. Subodh Singh's legacy as an inventor continues to inspire and shape the landscape of metrology, leaving an indelible mark on the industry.