Su-Hyun Gong

Title: Su-Hyun Gong: Innovator in Semiconductor Inspection Technology

Introduction

Su-Hyun Gong is a prominent inventor based in Seoul, South Korea. She has made significant contributions to the field of semiconductor technology, particularly in the area of wafer inspection. Her innovative methods have the potential to enhance the efficiency and accuracy of semiconductor device fabrication.

Latest Patents

Su-Hyun Gong holds a patent titled "Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the same." This patent describes a comprehensive semiconductor wafer inspection method that includes several key steps. The process involves providing a wafer with target and reference dies, obtaining candidate and reference images, and performing imaging processes to achieve high-resolution images. The method ultimately detects defect signals based on a difference image, which is crucial for ensuring the quality of semiconductor devices. She has 1 patent to her name.

Career Highlights

Throughout her career, Su-Hyun Gong has worked with notable organizations, including Samsung Electronics Co., Ltd. and Korea University Research and Business Foundation. Her experience in these esteemed institutions has allowed her to develop and refine her innovative techniques in semiconductor technology.

Collaborations

Su-Hyun Gong has collaborated with talented individuals in her field, including Q-Han Park and Sung Yoon Ryu. These collaborations have contributed to her success and the advancement of semiconductor inspection methods.

Conclusion

Su-Hyun Gong is a trailblazer in the semiconductor industry, with her innovative patent addressing critical challenges in wafer inspection. Her work continues to influence the development of more efficient semiconductor devices.