Mountain View, CA, United States of America

Stewart Williams

This inventor holds 1 USPTO granted patent. Top assignee: Synopsys, Inc.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stewart Williams. Retrieved from https://idiyas.com/inventor/stewart-williams

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Stewart Williams and Safety-Aware System Design

Introduction

Stewart Williams is an inventor based in Mountain View, California. His patent work addresses how safety requirements can be incorporated into system designs and verified through design tools.

Latest Patents

Williams is associated with 1 patent, titled “Implementing and Verifying Safety Measures in a System Design Based on Safety Specification Generated from Safety Requirements.” The invention describes a system that receives a design and its safety requirements, then generates a safety specification containing commands for implementing safety measures. Design tools can process that specification to enhance the system design in accordance with the requirements.

Career Highlights

Williams is associated with Synopsys, Inc., a company whose design tools support the development and verification of electronic systems. His patent reflects an approach to integrating safety measures into design workflows.

Collaborations

The provided information identifies Kaushik De and Meirav Nitzan as Williams’s coworkers. Their shared professional context is associated with Synopsys, Inc.

Conclusion

Stewart Williams’s patent focuses on translating safety requirements into actionable specifications that design tools can use to incorporate safety measures into system designs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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