This inventor holds 3 USPTO granted patents. Top assignee: Wyko, Inc.. Active years: 1991-1992.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1991-1992
Title: Innovations of Steven R. Lange
Introduction
Steven R. Lange is an accomplished inventor based in Tucson, AZ. He has made significant contributions to the field of optical engineering, particularly in the area of corneal measurement and infrared interferometry. With a total of three patents to his name, Lange's work has advanced the technology used in medical and scientific applications.
Latest Patents
One of Lange's latest patents is titled "Method and apparatus for measuring corneal topography." This invention involves a thin, flexible, reflecting diffuse material that is placed on the anterior surface of the cornea. The material is designed to conform precisely to changes in the shape of the cornea, allowing for remote sensing of its shape through projected fringe contouring. Another notable patent is the "Alignment system and method for infrared interferometer." This system aligns a test beam of an infrared interferometer with a reference beam using a phosphor screen illuminated by ultraviolet light. The interaction between the infrared laser light and the phosphor screen creates a dark spot that can be adjusted to achieve alignment, enhancing the accuracy of the interferometer.
Career Highlights
Lange is currently employed at Wyko, Inc., where he continues to innovate and develop new technologies. His work has been instrumental in improving measurement techniques in various scientific fields.
Collaborations
Lange collaborates with Edmond H. Thall, contributing to advancements in their respective fields.
Conclusion
Steven R. Lange's innovative patents and contributions to optical engineering demonstrate his commitment to advancing technology in medical and scientific applications. His work continues to influence the industry and improve measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile