The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1991
Filed:
Jun. 28, 1990
Steven R Lange, Tucson, AZ (US);
Wyko Corporation, Tucson, AZ (US);
Abstract
A system for aligning a test beam of an infrared interferometer with a reference beam thereof includes a phosphor screen positioned in a common path of the interferometer at a focal point of a lens in the path. The phosphor screen is illuminated with ultraviolet light to stimulate an area of the phosphor screen to emit visible light. Infrared laser light from the test beam is focused onto a spot of the phosphor screen. The infrared laser light acts on the spot to prevent the phosphor screen from emitting visible light from the spot and hence the position where the laser beam strikes the phosphor screen appears dark. Visible light emitted by the phosphor screen is focused into a visible light camera, and an image of visible light emitted by the phosphor screen is produced on a video monitor. The dark spot on the phosphor screen appears as an image spot on the video monitor. The test beam is adjusted to move the image spot to a predetermined location of the video monitor representing an aligned condition. In the described embodiment, infrared light in the reference arm of the interferometer is blocked to prevent it from being focused onto the phosphor screen. After alignment of the test beam, the phosphor screen is removed from the path to allow an interference beam produced by interference between the reference beam and the test beam to be imaged into an infrared camera.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile