Ortonville, MI, United States of America

Steven R Abram

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Gm Global Technolgoy Operations, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven R Abram. Retrieved from https://idiyas.com/inventor/steven-r-abram

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Steven R. Abram: Vehicle Sensor Installation Innovation

Introduction

Steven R. Abram is an inventor associated with Ortonville, Michigan, and General Motors Global Technology Operations, Inc. His patent work addresses vehicle sensor installation and the reliability of directional information used by vehicle systems.

Latest Patents

Abram is named on 1 patent: “Methods, Program Products, and Systems for Controlling for Improper Installation of Vehicle Sensors.” The invention describes determining a first indication of direction based at least in part on a vehicle’s yaw value and a second indication based at least in part on its steering angle. If the indications are inconsistent, the method changes the second indication to account for possible improper sensor installation.

Career Highlights

Abram’s listed patent reflects work on methods and systems for identifying and correcting inconsistencies in vehicle sensor data. Such techniques can help vehicle systems respond more reliably when sensors are installed improperly.

Collaborations

The patent information also names Paul S. Shaub and Thomas H. Tu as Abram’s coworkers.

Conclusion

Steven R. Abram’s patent focuses on improving the handling of vehicle direction data by detecting and addressing inconsistencies that may result from improper sensor installation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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