Needham, MA, United States of America

Steven A Lis


Average Co-Inventor Count = 1.4

ph-index = 6

Forward Citations = 178(Granted Patents)


Location History:

  • Lexington, MA (US) (1993)
  • Needham, MA (US) (1982 - 1996)

Company Filing History:


Years Active: 1982-1996

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7 patents (USPTO):Explore Patents

Title: Innovations of Steven A. Lis

Introduction

Steven A. Lis is a notable inventor based in Needham, MA, with a significant contribution to the field of optical measurement systems. He holds a total of seven patents, showcasing his expertise and innovative spirit in developing advanced technologies.

Latest Patents

Among his latest patents, Lis has developed an apparatus and methods employing harmonic analysis for measuring phase differences between coherent beams. This improved interferometric measuring system includes a phase modulator that generates a phase-modulated beam signal. A beam combiner then combines this signal with a second coherent beam to produce a combined beam signal. A detector element measures the intensity of this combined signal, while a data processor analyzes the intensity to determine the phase difference based on the harmonic components. Additionally, he has created an interferometric measuring system with temperature compensation, which projects two beams of light at different wavelengths to measure changes in the position of a measurement reflector, while also accounting for atmospheric disturbances.

Career Highlights

Throughout his career, Steven A. Lis has worked with several companies, including Sparta, Inc. and Sparta Systems, Inc. His work has significantly impacted the development of optical measurement technologies.

Collaborations

Lis has collaborated with notable individuals in his field, including Philip Dennis Henshaw and Harvey B. Serreze. Their combined expertise has contributed to advancements in optical measurement systems.

Conclusion

Steven A. Lis is a distinguished inventor whose work in interferometric measuring systems has paved the way for innovative solutions in optical measurements. His contributions continue to influence the field and inspire future advancements.

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