The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 1996

Filed:

Jan. 13, 1995
Applicant:
Inventors:

Philip D Henshaw, Carlisle, MA (US);

Steven A Lis, Needham, MA (US);

Assignee:

Sparta, Inc., Lexington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ;
Abstract

An improved interferometric measuring system that includes a system for measuring a phase difference between two coherent beams oscillating at substantially the same frequency, and including a phase modulator disposed into optical communication with one of the coherent beams and being adapted to generate a phase modulated beam signal. A beam combiner combines the phase modulated beam signal with the second one of the coherent beams to generate a combined beam signal. A detector element measures the intensity of the combined beam signal and a date processor analyzes the intensity to determine from the harmonic components of the combined beam signal the phase difference between the two coherent beams.


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