Company Filing History:
Years Active: 2019-2021
Title: Steve Scranton: Innovator in Wafer and Photomask Inspection Technologies
Introduction
Steve Scranton is a notable inventor based in San Martin, CA (US). He has made significant contributions to the field of wafer and photomask inspection technologies. With a total of 2 patents, his work has advanced the capabilities of inspection systems in the semiconductor industry.
Latest Patents
Steve's latest patents focus on systems, devices, and methods for combined wafer and photomask inspection. These innovations provide chucks that include a removable insert designed to support a wafer, ensuring that the examination surface lies within a focal range in the first configuration. Additionally, the chucks feature a structure that forms a recess to support a photomask, allowing for optimal examination in the second configuration.
Career Highlights
Steve Scranton is currently employed at Nanotronics Imaging, Inc., where he continues to develop cutting-edge technologies. His expertise in the field has positioned him as a key player in advancing inspection methodologies.
Collaborations
Steve has collaborated with notable coworkers such as Randolph E Griffith and Jeff Andresen, contributing to the innovative environment at Nanotronics Imaging, Inc.
Conclusion
Steve Scranton's contributions to wafer and photomask inspection technologies exemplify his commitment to innovation in the semiconductor industry. His patents reflect a deep understanding of the complexities involved in inspection systems, paving the way for future advancements.