DeForest, WI, United States of America

Steve Rounsley

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Abs Global, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steve Rounsley. Retrieved from https://idiyas.com/inventor/steve-rounsley-1iccw6ug

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Steve Rounsley: Innovator in Genetic Sample Processing

Introduction

Steve Rounsley is a notable inventor based in DeForest, Wisconsin. He has made significant contributions to the field of genetic sample processing. His work focuses on methods and systems that enhance the determination of identity and detection of contamination in genetic samples.

Latest Patents

Rounsley holds a patent titled "Methods and Systems for Processing Genetic Samples to Determine Identity or Detect Contamination." This patent showcases his innovative approach to improving genetic analysis techniques. He has 1 patent to his name, reflecting his commitment to advancing technology in this critical area.

Career Highlights

Steve Rounsley is currently employed at ABS Global, Inc., where he applies his expertise in genetic processing. His role at the company allows him to work on cutting-edge projects that have the potential to impact various fields, including agriculture and medicine.

Collaborations

Throughout his career, Rounsley has collaborated with talented individuals such as Matthew Campbell and Patrice Linel. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Steve Rounsley is a dedicated inventor whose work in genetic sample processing is paving the way for advancements in the field. His contributions are valuable to both scientific research and practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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