The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Oct. 21, 2021
Applicant:

Abs Global, Inc., DeForest, WI (US);

Inventors:

Jennifer Dzelil, Waunakee, WI (US);

Matthew Campbell, Waunakee, WI (US);

Steve Rounsley, DeForest, WI (US);

Patrice Linel, DeForest, WI (US);

Assignee:

ABS GLOBAL, INC., DEFOREST, US;

Primary Examiner:
Int. Cl.
CPC ...
U.S. Cl.
CPC ...
C12Q 1/6809 ; C12Q 1/686 ; C12Q 1/6869 ; C12Q 1/6876 ;

Find Patent Forward Citations

Dzelil, Jennifer. (2025). Methods and systems for processing genetic samples to determine identity or detect contamination (U.S. Patent No. 12497648). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12497648

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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