Waunakee, WI, United States of America

Matthew Campbell

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Abs Global, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Campbell. Retrieved from https://idiyas.com/inventor/matthew-campbell-fsiaieho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Matthew Campbell: Innovator in Genetic Sample Processing

Introduction

Matthew Campbell is an accomplished inventor based in Waunakee, Wisconsin. He has made significant contributions to the field of genetic sample processing. His innovative work focuses on methods and systems that enhance the determination of identity and detection of contamination in genetic samples.

Latest Patents

Matthew holds a patent for "Methods and Systems for Processing Genetic Samples to Determine Identity or Detect Contamination." This patent showcases his expertise in developing advanced techniques that are crucial for genetic analysis.

Career Highlights

Matthew is currently employed at ABS Global, Inc., where he applies his knowledge and skills to further advancements in genetic research. His work at ABS Global has positioned him as a key player in the industry, contributing to the company's reputation for innovation.

Collaborations

Matthew collaborates with talented individuals such as Steve Rounsley and Jennifer Dzelil. These partnerships enhance the creative process and lead to groundbreaking advancements in their field.

Conclusion

Matthew Campbell is a notable inventor whose work in genetic sample processing is paving the way for future innovations. His contributions are vital to the ongoing development of genetic analysis technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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