St. Cloud, MN, United States of America

Steve Rott


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017-2021

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3 patents (USPTO):Explore Patents

Title: Steve Rott: Innovator in Microcircuit Testing

Introduction

Steve Rott is a notable inventor based in St. Cloud, MN (US). He has made significant contributions to the field of microcircuit testing, holding a total of 3 patents. His work focuses on developing advanced testing apparatuses that enhance the efficiency and accuracy of microcircuit evaluations.

Latest Patents

One of Steve Rott's latest patents is a testing apparatus and method for microcircuit testing featuring a conical bias pad and conductive test pin rings. This innovative test system provides an array of test probes that pass through an upper probe guide retainer. The retainer is designed with multiple slots that securely hold the probes in place, preventing any rotation. Additionally, a series of flex circuits at varying heights engage the bottom ends of the probes, ensuring a continuous electrical connection to a load board. The test probes are bonded to the flex circuits using a ring-shaped flowable conductive material. To maintain optimal contact, the flex circuits are biased against the load board by an elastomeric pad with spaced conical projections.

Career Highlights

Steve Rott is currently employed at Johnstech International Corporation, where he continues to innovate in the field of microcircuit testing. His expertise and dedication have positioned him as a key player in the development of advanced testing technologies.

Collaborations

Steve has collaborated with notable coworkers, including John DeBauche and Dan Campion, who share his commitment to innovation and excellence in microcircuit testing.

Conclusion

Steve Rott's contributions to microcircuit testing through his patents and work at Johnstech International Corporation highlight his role as a significant inventor in the field. His innovative approaches continue to shape the future of microcircuit testing technology.

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