The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jul. 10, 2014
Johnstech International Corporation, Minneapolis, MN (US);
John DeBauche, White Bear Township, MN (US);
Dan Campion, Chanhassen, MN (US);
Michael Andres, Inver Grove Heights, MN (US);
Steve Rott, St. Cloud, MN (US);
Jeffrey Sherry, Savage, MN (US);
Brian Halvorson, St. Paul, MN (US);
Brian Eshult, St. Paul, MN (US);
Johnstech International Corporation, Minneapolis, MN (US);
Abstract
The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes are biased upwardly through the retainer by an elastomeric block having a similar array of slots. The elastomer is then capped at its bottom by a second or lower retainer with like slots to form a sandwich with the elastomer therebetween. The bottom ends of the probes are group by probe height. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and take continue the circuits to a probe card where test signals originate.