John DeBauche

Title: Innovations by John DeBauche

Introduction

John DeBauche is a notable inventor based in White Bear Township, MN (US). He has made significant contributions to the field of microcircuit testing, holding a total of 3 patents. His work focuses on enhancing the efficiency and accuracy of testing apparatuses used in the electronics industry.

Latest Patents

One of John DeBauche's latest patents is a testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings. This innovative test system provides an array of test probes that pass through a first or upper probe guide retainer. The retainer features a plurality of slots sized to receive the probes in a manner that prevents rotation. Additionally, a plurality of flex circuits at different heights engage the bottom probe ends at their respective height levels, continuing the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits using ring-shaped flowable conductive material. Furthermore, the flex circuits are biased against a load board by an elastomeric pad with spaced apart conical projections.

Career Highlights

John DeBauche is currently employed at Johnstech International Corporation, where he continues to innovate in the field of microcircuit testing. His expertise and inventions have contributed to advancements in testing technologies, making significant impacts in the industry.

Collaborations

Throughout his career, John has collaborated with talented individuals such as Dan Campion and Michael W. Andres. These collaborations have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies.

Conclusion

John DeBauche's contributions to microcircuit testing exemplify the spirit of innovation in the electronics industry. His patents and career achievements highlight his dedication to improving testing methodologies, making him a valuable figure in the field.