Lakeway, TX, United States of America

Steve Munroe

This inventor holds 1 USPTO granted patent. Top assignee: Teradyne, Inc.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steve Munroe. Retrieved from https://idiyas.com/inventor/steve-munroe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Steve Munroe: Innovator in Jitter Measurement Technology

Introduction

Steve Munroe is a notable inventor based in Lakeway, TX (US). He has made significant contributions to the field of jitter measurement technology. His innovative approach has led to the development of a unique patent that enhances the accuracy of jitter measurement in electronic devices.

Latest Patents

Steve Munroe holds a patent for a "Jitter measurement algorithm using locally in-order strobes." This method provides a systematic approach to measuring jitter by sampling a device-under-test (DUT) output signal that has a repeating pattern. The process involves using an asynchronous clock to sample the DUT output over a specified period, ensuring that each period of the repeating pattern is sampled at least twice. The sampling frequency is determined by user inputs, allowing for flexibility in measurement. The method captures logical state information representing each edge of a single period of the DUT signal, which is then processed independently within subsets before combining the results for a comprehensive analysis.

Career Highlights

Steve Munroe is currently employed at Teradyne, Inc., where he applies his expertise in electronic testing and measurement. His work focuses on developing advanced technologies that improve the reliability and performance of electronic devices. With a strong background in engineering and innovation, he continues to push the boundaries of what is possible in his field.

Collaborations

Steve has collaborated with talented individuals such as Michael C Panis and John Robert Pane. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Steve Munroe's contributions to jitter measurement technology exemplify the spirit of innovation. His patent and work at Teradyne, Inc. highlight his commitment to advancing electronic testing methodologies. Through his efforts, he continues to make a significant impact in the field of engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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