Aberdeen, United Kingdom

Steve Helmore

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: E.v. Offshore Limited. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steve Helmore. Retrieved from https://idiyas.com/inventor/steve-helmore

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Steve Helmore - Innovator in Pipe Geometry Measurement

Introduction

Steve Helmore is a notable inventor based in Aberdeen, GB. He has made significant contributions to the field of pipe geometry measurement, particularly through his innovative patent. His work focuses on improving the accuracy and efficiency of determining the geometry of deformed pipes and conduits.

Latest Patents

Steve Helmore holds a patent for a "System and method for determining deformed pipe geometry." This patent describes a method and associated system that collects and processes measurement data to determine the geometrical properties of a deformed pipe or conduit. The method involves using equipment centered in the pipe at multiple points to gather data, selecting a deformation type, and processing the data to derive geometrical properties indicative of the pipe's deformations.

Career Highlights

Throughout his career, Steve has been associated with E.V. Offshore Limited, where he applies his expertise in the field of pipe measurement technologies. His innovative approach has led to advancements that benefit various industries reliant on accurate pipe geometry assessments.

Collaborations

Due to space constraints, the details of Steve Helmore's collaborations are not included.

Conclusion

Steve Helmore's contributions to the field of pipe geometry measurement through his innovative patent demonstrate his commitment to advancing technology in this area. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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