The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Apr. 03, 2015
Applicant:

E.v. Offshore Limited, Norwich, GB;

Inventor:

Steve Helmore, Aberdeen, GB;

Assignee:

E.V. Offshore Limited, Norwich, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/24 (2006.01); E21B 47/02 (2006.01); E21B 47/08 (2012.01); G01B 3/56 (2006.01); G01B 5/12 (2006.01); G01B 5/207 (2006.01); G01B 5/252 (2006.01);
U.S. Cl.
CPC ...
G01B 3/24 (2013.01); E21B 47/02 (2013.01); E21B 47/08 (2013.01); G01B 3/56 (2013.01); G01B 5/12 (2013.01); G01B 5/207 (2013.01); G01B 5/252 (2013.01);
Abstract

A method and associated system for determining geometry of a deformed pipe or conduit or wellbore, the method comprising: collecting, determining and/or receiving measurement data indicative of a plurality of radii of the pipe or conduit using equipment centred in the pipe at two or more points a known distance from the measurement point but not at the measurement point itself; selecting a deformation type and/or deformation model; processing the measurement data to determine one or more geometrical properties of the pipe or conduit, the geometrical properties being indicative of, or associated with, one or more deformations, shapes or profiles of at least part of the pipe or conduit; and guiding and/or constraining at least a part of the processing of the measurement data using the selected deformation type or model and/or fitting the selected deformation model to the measurement data.


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