Fremont, CA, United States of America

Steve (Yifeng) Cui


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovative Contributions of Steve (Yifeng) Cui in Surface Defect Inspection

Introduction

Steve (Yifeng) Cui is an accomplished inventor based in Fremont, California. He holds a significant patent in the field of surface defect inspection, reflecting his contributions to advancements in technology. His work focuses on improving methods for monitoring large particles during surface inspections, showcasing his expertise and innovative spirit.

Latest Patents

Steve Cui's most notable patent addresses "Surface defect inspection with large particle monitoring and laser power control." This patent introduces methods and systems designed to minimize illumination intensity while scanning over large particles. The technology enables a surface inspection system to identify the presence of large particles in the inspection path using separate leading measurement spots. One of the key features of this invention is the reduction of incident illumination power during the detection of large particles, thereby enhancing the accuracy of surface inspections.

Career Highlights

Steve is currently employed at Kla Tencor Corporation, where he continues to drive innovation and development in advanced inspection technologies. His patent exemplifies his commitment to improving inspection methods and contributes to the efficiency of semiconductor manufacturing processes. With his extensive knowledge and experience, he plays a vital role in the ongoing advancements in this field.

Collaborations

Throughout his career, Steve has collaborated with notable colleagues, including Chunsheng J Huang and Chunhai Wang. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and innovation, further enhancing the technological advancements within their organization.

Conclusion

Steve (Yifeng) Cui's innovative work in surface defect inspection underscores the importance of research and development in technology. His contributions not only reflect his individual talent but also signify the collective efforts of his team at Kla Tencor Corporation. As the industry continues to evolve, Steve's commitment to innovation promises to influence the future of surface inspection technologies significantly.

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