Stephen M Schwarz

Title: Innovations of Stephen M. Schwarz in Crystallographic Metrology

Introduction

Stephen M. Schwarz is an accomplished inventor based in Merritt Island, FL (US). He has made significant contributions to the field of crystallography through his innovative patent. His work focuses on enhancing the accuracy and efficiency of crystallographic measurements.

Latest Patents

Stephen M. Schwarz holds a patent for a system titled "Crystallographic Metrology and Process Control." This invention includes a sample holder, an electron source for generating an electron beam, and a scanning actuator for controlling the relative movement between the electron beam and the crystalline sample. The scanning actuator is designed to direct the electron beam at a series of spaced-apart points within the sample area. Additionally, the system features an image processor that generates crystallographic data based on electron diffraction from the crystalline sample. It also determines whether sufficient data have been acquired to characterize the sample area. The controller within the system manages the scanning actuator to ensure that the points are spaced apart, allowing the acquired data to represent different grains within the crystalline sample.

Career Highlights

Stephen M. Schwarz is associated with Agere Systems Inc., where he has applied his expertise in crystallography. His innovative approach has led to advancements in the field, particularly in the area of process control and metrology.

Collaborations

Throughout his career, Stephen has collaborated with notable colleagues, including Erik Cho Houge and Brian Kempshall. These collaborations have contributed to the development and refinement of his innovative technologies.

Conclusion

Stephen M. Schwarz's contributions to crystallographic metrology exemplify the impact of innovation in scientific research. His patent reflects a significant advancement in the field, showcasing his dedication to improving measurement techniques.