The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Feb. 24, 2003
Erik C. Houge, Orlando, FL (US);
Brian Kempshall, Casselberry, FL (US);
Stephen M. Schwarz, Merritt Island, FL (US);
Fred A. Stevie, Cary, NC (US);
Erik C. Houge, Orlando, FL (US);
Brian Kempshall, Casselberry, FL (US);
Stephen M. Schwarz, Merritt Island, FL (US);
Fred A. Stevie, Cary, NC (US);
Agere Systems, Inc., Allentown, PA (US);
Abstract
A system () for crystallography including a sample holder (), an electron source () for generating an electron beam, and a scanning actuator () for controlling the relative movement between the electron beam and the crystalline sample, the scanning actuator being controllable for directing the electron beam at a series of spaced apart points within the sample area. The system also includes an image processor () for generating crystallographic data based upon electron diffraction from the crystalline sample and for determining whether sufficient data have been acquired to characterize the sample area. The system further includes a controller () for controlling the scanning actuator to space the points apart such that acquired data is representative of a different grains within the crystalline sample. IN other embodiments, the invention includes one or more ion beams () for crystallography and a combination ion beam/electron beam ().