Fred Anthony Stevie

Title: Fred Anthony Stevie: Innovator in Crystallographic Metrology

Introduction

Fred Anthony Stevie is a notable inventor based in Orlando, FL (US), recognized for his contributions to the field of crystallography. With a total of 9 patents to his name, Stevie has made significant advancements in the technology used for crystallographic metrology and process control.

Latest Patents

Among his latest patents is a system for crystallography that includes a sample holder, an electron source for generating an electron beam, and a scanning actuator for controlling the relative movement between the electron beam and the crystalline sample. This innovative system is designed to direct the electron beam at a series of spaced apart points within the sample area. Additionally, it features an image processor that generates crystallographic data based on electron diffraction from the crystalline sample, determining whether sufficient data have been acquired to characterize the sample area. The system also includes a controller that spaces the points apart to ensure that the acquired data is representative of different grains within the crystalline sample. In other embodiments, the invention incorporates one or more ion beams for crystallography and a combination ion beam/electron beam.

Another significant patent is a method and apparatus used to calibrate high-resolution electron microscopes. This invention utilizes a single standard that provides multiple samples, each with a different atomic structure, allowing for rapid and accurate calibration across the entire range of magnifications. The method involves adjusting the S/TEM to focus on the crystal lattice structure of each sample in a selected sequence, comparing measurements of lattice spacings to known dimensions, and adjusting the S/TEM magnification as necessary.

Career Highlights

Fred Anthony Stevie has worked with several prominent companies, including Agere Systems Inc. and Agere Systems Guardian Corporation. His experience in these organizations has contributed to his expertise in the field of crystallography and metrology.

Collaborations

Throughout his career, Stevie has collaborated with notable individuals such as Erik Cho Houge and John Martin McIntosh, further enhancing his contributions to the field.

Conclusion

Fred Anthony Stevie's innovative work in crystallographic metrology has led to significant advancements in the technology used for electron microscopy and crystallography. His patents reflect a deep understanding of the complexities involved in these fields, showcasing his role as a key inventor in the industry.