Cupertino, CA, United States of America

Stephen Hyatt

This inventor holds 1 USPTO granted patent. Top assignee: Mattson Technology, Inc. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen Hyatt. Retrieved from https://idiyas.com/inventor/stephen-hyatt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stephen Hyatt

Introduction

Stephen Hyatt is an accomplished inventor based in Cupertino, CA. He is known for his contributions to the field of wafer processing technology. With a focus on improving manufacturing processes, Hyatt has made significant strides in the industry.

Latest Patents

Hyatt holds a patent for a "Wafer tilt detection apparatus and method." This innovative device enhances the control of wafer processing by utilizing an endpoint signal to determine when a wafer is in a tilted orientation during processing. His invention aims to improve the accuracy and efficiency of wafer manufacturing.

Career Highlights

Stephen Hyatt is currently employed at Mattson Technology, Inc., where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the capabilities of wafer processing equipment. With a total of 1 patent, Hyatt's contributions are recognized within the industry.

Collaborations

Hyatt has collaborated with notable colleagues, including Songlin Xu and Li Hou. Their combined expertise has fostered innovation and development in wafer processing technologies.

Conclusion

Stephen Hyatt's work exemplifies the spirit of innovation in the field of wafer processing. His patent and contributions to Mattson Technology, Inc. highlight his commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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