This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Bühler Alzenau Gmbh. Active years: 2025.
Company Filing History:
Years Active: 2025
Title: Steffen Guertler: Innovator in In-Situ Measurement Systems
Introduction
Steffen Guertler is a notable inventor based in Böhlen, Germany. He has made significant contributions to the field of measurement systems, particularly in the area of in-situ ion beam etch rate and deposition rate measurement. His innovative work has implications for various applications in material science and engineering.
Latest Patents
Steffen Guertler holds a patent for an "In-situ etch rate or deposition rate measurement system." This system includes a vacuum chamber and an ion beam source that directs an ion beam onto a sample's surface. The system is designed to measure the etch rate or deposition rate in real-time, utilizing an interferometric measurement device to analyze light reflected from the sample. This technology enhances the precision of material processing techniques.
Career Highlights
Steffen Guertler is associated with Bühler Alzenau GmbH, where he applies his expertise in developing advanced measurement systems. His work at the company has positioned him as a key player in the innovation of technologies that improve manufacturing processes.
Collaborations
Steffen collaborates with talented professionals such as Mario Berlinger and Ralf Sperling. Their combined efforts contribute to the advancement of technologies in their field.
Conclusion
Steffen Guertler's contributions to in-situ measurement systems exemplify the importance of innovation in technology. His patent and work at Bühler Alzenau GmbH reflect a commitment to enhancing material processing techniques.