La Troche, France

Steffen Chladek


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Steffen Chladek: Innovator in RF Testing Technology

Introduction

Steffen Chladek is a notable inventor based in La Troche, France. He has made significant contributions to the field of radio frequency (RF) testing technology. His innovative approach has led to advancements that enhance the accuracy and efficiency of automatic test equipment.

Latest Patents

Steffen Chladek holds a patent for a method and apparatus titled "LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers." This invention focuses on a method for radio frequency vector calibration of s-parameter measurements to the tips of wafer probe needles. The technique employs a modified Line-Reflect-Line (LRL) calibration routine, which utilizes a Thru-Reflect-Line to LRL shift. This innovation eliminates the need for a precisely characterized reflect standard, which is typically required in conventional LRL calibration. Furthermore, the method addresses the non-ideal effects of the non-zero length thru standard, thereby improving the measurement accuracy of the tester.

Career Highlights

Steffen Chladek is currently associated with Credence Systems Corporation, where he continues to develop cutting-edge technologies in the RF testing domain. His work has been instrumental in advancing the capabilities of automatic test equipment, making significant impacts in the industry.

Collaborations

Steffen collaborates with Martin Breinbauer, a fellow innovator in the field. Their combined expertise contributes to the ongoing development of advanced testing solutions.

Conclusion

Steffen Chladek's contributions to RF testing technology exemplify the spirit of innovation. His patented methods enhance measurement accuracy and efficiency, marking him as a key figure in the industry.

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