Thun, Switzerland

Steffen Bräkling

This inventor holds 1 USPTO granted patent. Top assignee: Tofwerk Ag. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steffen Bräkling. Retrieved from https://idiyas.com/inventor/steffen-bräkling

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Steffen Bräkling: Innovator in Mass Analysis Technology

Introduction

Steffen Bräkling is a notable inventor based in Thun, Switzerland. He has made significant contributions to the field of mass analysis technology. His innovative approach has led to the development of a unique method and apparatus for mass analyzing samples.

Latest Patents

Steffen Bräkling holds a patent for a method and apparatus for mass analyzing a sample. The invention involves ionizing a sample to produce first and second sample ions. It also includes obtaining mass spectra from these ions using a mass analyzer. The method allows for repeated assays from the sample, which are then transferred to an ion source for ionization. This process results in the generation of mass spectra that can be analyzed for various applications.

Career Highlights

Steffen Bräkling is associated with Tofwerk AG, a company known for its advancements in mass spectrometry technology. His work has been instrumental in enhancing the capabilities of mass analysis, making it more efficient and effective.

Collaborations

Steffen collaborates with talented individuals such as Sonja Klee and Marc Gonin. Their combined expertise contributes to the innovative projects at Tofwerk AG.

Conclusion

Steffen Bräkling's contributions to mass analysis technology exemplify the spirit of innovation. His patent and work at Tofwerk AG highlight the importance of advancements in scientific research and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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