The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Apr. 20, 2022
Tofwerk Ag, Thun, CH;
Sonja Klee, Reutigen, CH;
Steffen Bräkling, Thun, CH;
Marc Gonin, Thun, CH;
Urs Rohner, Thun, CH;
Carsten Stoermer, Thun, CH;
TOFWERK AG, Thun, CH;
Abstract
The invention relates to a method for mass analysing a sample by ionising the sample to first sample ions and to second sample ions and by obtaining mass spectra from the first sample ions and the second sample ions with a mass analyser (). Thereby, repeatedly, a first assay is obtained from the sample and transferred past any chromatography column to a first ion source () and ionised by the first ion source () to the first sample ions, wherein the first sample ions obtained from the respective first assay are transferred to the mass analyser (), wherein at least one first mass spectrum is obtained with the mass analyser () from the first sample ions obtained from the respective first assay and ionised by and transferred from the first ion source (). Furthermore, at least once, a second assay is obtained from the sample within a time window being associated with the respective second assay and having a window width, wherein the respective second assay is transferred for chromatographic separation via a chromatography column () to at least one second ion source () in that after being chromatographically separated, the respective second assay eluting from the chromatography column () is transferred to the at least one second ion source () and ionised by the at least one second ion source () to the second sample ions, wherein the second sample ions obtained from the respective second assay are transferred to the mass analyser (), wherein at least one second mass spectrum is obtained with the mass analyser () from the second sample ions obtained from the respective second assay which has been ionised by and transferred from the at least one second ion source (). Thereby, each one of the at least one second mass spectrum is assigned to one or more of the at least one first mass spectrum from the first sample ions obtained from one of the first assays which has been obtained from the sample within the time window associated with the respective second assay which has been chromatographically separated and ionised by the at least one second ion source () to the second sample ions from which the respective one of the at least one second mass spectrum has been obtained. Furthermore, the invention relates to an apparatus () for mass analysing a sample with the method according to the invention.